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- Example 1 S100 Mode: 384 I/O’s populated w/ 512MB 72-Bit DIMMs per PEG
- Each Quadrant has 96 pins per DIMM
- 3 bits per pin times 96 pins= 288 bits per vector
- 288 bits/vector divided by 72 bits/Word= 4 Words/Vector
- 512MB DIMM actually comprised of nine 64Mx8 (512Mb) components or
- 9x64= 576 MB= 604 million bytes (decimal)
- 604 million byes divided by 9 bytes/word= 67.11Million words
- 67.11 Million Words divided by 4 Words/Vector= 16.78 Million Vectors
- Example 2 S200P+: 256 I+O@200MHz w/ 1GB DIMM’s (128Mx72)
- 2 Bits per pin x64 pins/PEG Quadrant= 128 bits/Quadrant round à 144 bits
- 1GB DIMM actually comprised of qty 9 128Mx8 (1Gb) components=1152MB or
1208 million bytes (decimal)
- 1208 Million bytes divided by 9 bytes/word=134.2 Million words
- 134.2 Million Words divided by 2 Words/Vector= 67.1M Vectors
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- Rule: entire PEG must be either all I/O's (96 max per PEG) or any
combination just I's and O's (192 max per PEG)
- Pin Mixing: if 1 PEG’s VMM were configure as 96 I/O's and the other 3
PEG's as 192 I's or O's then the customer would have 672 total DUT
signal pins comprised of 96 I/O and 192x3= 576 dedicated I's and O's
- 6 words required as follows: 192 channels x 2bits/channel in I+O mode=
384 bits
- 384 Bits/Word divided by 72 bits/word = 5.3 Words round-up to 6 Words
(zero fill).
- At 400 Mega Words/sec, divide by 6 words hence 66MHz pattern rate
- In the case of I/O: 3 bits/pin per Vector
- 384 I/O divided by 4 PEGs= 96 I/O channels per DIMM
- 72 Bits/Word divided by 3 bits/channel= 24 channels/word per vector
- therefore 96 channels divided by 24 Channels/Word= 4 words per Vector
- in the S100 Mode, the 200 MHz DDR2 DIMM VMM is delivering double-data
rate @400 Mega Words per sec or 4 72-bit words per 100 MHz
- In the + Speed Mode (200/267 MHz vector rate), only 2 words are
available at 400/533 Mega Word transfer rate:
- thus @ 2 Words x 72 bits/Word= 144 bits
- and 144 Bits divided by 2 Bits/CH= 72 Channels per PEG. Round down to
64. 64 Channels x 4 PEGs = 256 I's or O's
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- All Dut Lines Exactly 50 Ohms…
- All DUT Lines Are Equal Length…
- All DUT Lines Are Spread-out to minimze crosstalk...
- Transmission line theory: if the
round trip time of the line is less than the rise, then you do not have
a tranny
- Example 3 inch, 50 ohm line: 170 ns inch = 510 ps one way and 1 ns Round
Trip equals 1 ns edge
- If the line were 2 inches, then 680ps RT and no tranny to 1 ns edge
- Rule of Thumb: output impedance of the part must be 1/10 of the Zo line
- Stray Capacitance reaks havoc
with tranny equations
- To achieve 50 ohms, stray must be reduced to 5 pF
- Each connector a signal travels thru is several puff, each node it
touches such as relays and switches is some more
- DUT line spacing rules to maintain 50 ohms means more layers
- Each foot of good 50 ohm even adds 10 pF
- To accomplish no stubbs snuggle switches to isolate existing system’s
electronics
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- LMO500 upgradable plug-in module (17” x 14”, 23 layer PCB) called
FAST_PINS for at-speed testing:
- 100/200/400MHz vector pattern rate modes and fmax shmooing 1MHz
increments
- 768 signal pins
- Reconfigurable user-selectable ASIC I/O pin levels: all 3.3V, 2.5V,
1.8V, 1.5V 1.2Vsingle-ended and differential standards
- uses the existing 384 pin LMO Precision DC Parametic Unit (PMU)
delivered thru 1:2 transparent
ASM (Analog Switch Module)
- Also deploys 4 User DUT Power Supplies -3 to +7 (1.5 A)
- Thruput matters in production, of course, but also when debugging and
datalogging w/ measuring many pins for IIH, IIL, IZH, IZL, VOH, VOL at
VCC core and VCC I/O min and max corners
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- 50/100MHz die shrink to 200 MHz abandoned in 2001
- 70-90 MHz Voltage Comparator Problems
- 512 pins approx $500K, AtSpex 768 $100-200K
- Accuracy
- AtSpex: 90 nm PEG (Pin Electronics Gate Array) for emerging
- Added low end MSO
- Precision LMO Pin is Bipolar, AC parametrics 10 ps resolution, per-pin
calibration deskews EPA to < 100ps (Edge Placement Accuracy)
- Per-Pin CMOS 80 ps resolution
- Requires
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- The Enhanced Digital Channel Board improves J750 edge placement accuracy
from 500 ps to 325 ps, enabling customers to improve yields, increase
device specifications, and achieve significant savings in manufacturing.
- Semiconductors continue to move toward higher data rates for an
ever-widening array of devices. As chip speeds increase, so does the
need for accuracy in determining propagation delays and other
measurements.
- Test a wider range of devices
- The improved edge placement of the Enhanced Digital Channel Board
expands the range of the J750 to test a wider array of devices than ever
before. It's the ideal tool for testing microcontrollers, baseband
controllers, and FPGAs of up to 100 MHz.
- Easy to upgrade and use
- Current J750 users can extend capability and accuracy of their existing
systems at a low cost. The Enhanced Digital Channel Board functions like
the standard board - users will not notice any difference, other than
the improved accuracy. New customers can take advantage of the many
improvements made to the J750 including increased accuracy with the
Enhanced Digital Channel Board.
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- Competitive strategy is to drop the price from $2,300 to $1,700 on
100MHz model as they introduce the 200 MHz model.
- AtSpex base price for 384 maximum pins is $145,000 or $377 per pin.
- FAST_PINS upgrade $75 - $100,000 across 384 pins or $573 per pin.
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- The 768-200 architecturally adds fmax 100/200/400 MHz Functional Vector
Data Rate all pins can be clock or data
- Speed. Pattern Rates to 267 MHz
BEST IN CLASS
- Deep. Vector Depth to 100M BEST
IN CLASS
- Wide. 768 tester channels:
split-pins 384 Drivers, 384 Receviers
- Quick. Vector Loads enabled by Ethernet-to-the-Tester PCI DMA’ing over
the NorthBridge directly to memory
- Precision: Standard Pin AC parametrics: 100 ps Driver/Comparator edge
placement accuracy; DC parametrics: 12 bit resolution, 1/4LBS max
linearity error- calibrated to NIST-tracable 5 ½ digit DVM
- Fast. Mainframe-competitve AC and
DC parametric test times ex. 100
pin DUT w/ 25,000 vectors containing 4,000 transitions- 4 sec total to
measure and datalog to a file.
Time search algorithm averages 11 iterations to aquire an edge to
10 ps res.
- User tools: IEEE 1149 JTAG SCAN Programming Module, MS Windows user
interface, Windows WinCHARacterization per-pin digitizing scope, per-pin
Curve tracer; Self-test auto-verifies and datalogs all channels for
functional Drive/Compare and AC/DC source and measure
- And of course, Small- not only the world’s only known 100MHz benchtop IC
tester, the only 200/400. Approx
15 inches cubed and 500W at 120V, auto-cooling fans to 37 degrees
C. Previous 200MHz CMOS
architeture was in 4 square meters and 16,000 W.
- Microprogrammable FPGA-based tester hardware now includes the
vector processor unit (VPU), pin formatters, error logic and
pipelines and DUT I/O. ATSpex IP
includes PCI DMA Controller thru the N Bridge, 533 MB/s DDR2 1GB Gate
Array PEG, and embedded-Linux DMA2PEG device driver.
- Like a space satellite whose entire mission needs to be changed in
mid-flight, the Pin Electronics Gate Array is reconfigurable via the
test program loading a new image file ex’s. testing all the ASIC I/O
standards a device is cable of, configuring the VPU into an Algorithmic
Pattern Generator for embedded memory test
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- The 768-200 architecturally adds fmax AC Functional Vector Data Rate
across all channels, Vector Depth and increased Pin Count as well as
providing the original features of the acclaimed LMO500:
- Fast. Vector rates to
100/200/400MHz
- Deep. Up to 100+M vector pattern
depth
- Wide. 768 tester channels
- Quick. Deep Vector loads via
Ethernet PCI DMA
- And of course, Small- not only the world’s only known 100MHz benchtop IC
tester, the only 200/400. Approx
500W at 120V, auto-cooling fans to 37 degrees C
- Precision: Standard Pin AC parametrics: 100 ps Driver/Comparator EPA
edge placement accuracy; DC parametrics: 12 bit resolution, 1/4LBS max
linearity error- calibrated to NIST-tracable 5 ½ digit DVM
- Fast. Mainframe-competitve AC and
DC parametric test times ex. 100
pin DUT w/ 25,000 vectors containing 4,000 transitions- 4 sec total to
measure and datalog to a file.
Time search algorithm averages 11 iterations to aquire an edge to
10 ps res.
- Modern enabling technologies: 90 nm 1152 pin fBGA FPGA’s w/ state of the
art clock management DCMtm/DLL’s; 400/533 MB/s DDR2 PC4300 DIMMs; GB
file transfer via Gigabit Ethernet; PCI DMA IP, Embedded Linux
- User tools: IEEE 1149 JTAG SCAN Programming Module, MS Windows user
interface, Windows WinCHARacterization per-pin digitizing scope, per-pin
Curve tracer; Self-test auto-verifies and datalogs all channels for
functional Drive/Compare and AC/DC source and measure
- Microprogrammable FPGA-based tester hardware now includes the
vector processor unit (VPU), pin formatters, error logic and
pipelines and DUT I/O. ATSpex IP
includes PCI DMA Controller thru the N Bridge, 400-533 MB/s DDR
Controller, 200/400MHz , Vector Processor and Pin Electronics Gate Array
PEG, and embedded-Linux DMA2PEG device driver. Like a space satellite whose entire
mission needs to be changed in mid-flight, the Pin Electronics Gate
Array is reconfigurable via the test program loading a new image file ex’s.
testing all the ASIC I/O standards a device is cable of,
- configuring the VPU into an Algorithmic Pattern Generator for embedded
memory test
- tm trademark of Xilinx
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- –1MHz -500MHz range
- –20ps phase precision
- –Jitter < 10% of clock period
- –Duty cycle distortion < 5% of clock period
- Zero delay buffer
- Frequency synthesis
- 90-degree shifted output clocks
- Phase Shift control
- –Specify clock period fraction
- –Directly control delay line tap
- Dynamic Reconfiguration Port (DRP)
- –Adjust Multiply/Divide and Phase Shift values without reconfiguring
device
- •DCM reset required for M/D change
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- Uses solder bump connections across the chip’s surface
- Traditional I/O pads arranged around perimeter and chips pads wirebonded
to the package
- Eliminates the need for a pad ring- considerably reduces chip area
- Allows the I/O pads to be optimally placed in the middle of the
configurable logic array shortens the signal paths reduces L and C
- ASMBL tm –Striped I/O
- 11 levels of Cu metallization provide better signal routing and
configurability
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- 973 200/400MHz (multiplexed) CMOS and Bipolarà J2 400/800 MHz SiGe cancelled during the downturn of 2002
- Hi-end SOC Testers Mix of Bipolar and CMOS: Example LTX Fusion HFi
- 4 Digital channels comprised of a CMOS ASIC, 2 GaAs timing chips, 2
Dual Channel DR/CMP
- Cancelled Credence ValStar (2001) was 1st CMOS 200MHz machine
- 7 Watts /channel had to H2O cooled
- Our Bipolar ECLin ps LMA750 200MHz 256 pins
- 131 pin ECL Gate Array per pin Timing Controller 7.5 Watts/pin
- Edge Semi or Analog Devices DR/CMP/LD: 5 Watts/pin
- 84 pins took 190 cfm fan- temp of system 70 degrees C
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- DUT facing Pin Drivers/Rec’vrs:
- 192 @ 100MHz (96 I/O) VCCO= 3.3, 2.5, 18. 1.5
- PCI pins:
- Test Vector DIMM
- DUT Misc Pins: 7 enable loop, clock loop, local loop
- FPGA Sync 24 position run en, fail count
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- 200/267 MHz I/O Pins Required
- 72 DQ’s 72
- 8 Differential Pairs Bidirectional Data Strobes 16 8 CLK’s and 8
Klunks
- ----
- 88 FAST I/O
- Dedicated Input Pins
- Command Bus: /CS, /RAS, /CAS, /WE 4
- 3 differential CLK pairs 6 3 CLK’s and 3 Klunks
- Nine Write Data Masks- 1 per per byte 9
- Clock Enable 1
- Multiplexed Address Bus 14
- ---- 34 FAST IN’s
- Specialty I/O Pins
- SDA 1
- Check Bits 8
- ---
- 9 I/O’s
- Specialty In Pins
- -------
- Total 97 I/O’s and 39 I’s
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- (
input [2:0] CLK,
input [2:0]
CLK_N,
input CKE,
input CS_N,
input RAS_N,
input CAS_N,
input WE_N,
inout [8:0]
DM_RDQS,
input [1:0] BA ,
input [13:0] ADDR ,
inout [71:0] DQ ,
inout [8:0] DQS ,
inout [8:0] DQS_N ,
output [8:0] RDQS_N
,
input ODT
);
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- Propagation delay (tpd) is a function of frequency and can vary by
several nanoseconds (ns) - killer.
- TPD HL versus TPD LH variance up
to several ns due to PNP NPN totem pole mismatch.
- Poor pulse width control so bad
as a clock generator.
- Pin to pin skew up to several ns
and this is improvement over last year!
- power dissipated only when
switching: Voltage squared x frequency x C Load.
- drift in tpd 80 picoseconds (ps)
per degree Celsius.
- LMO creates a convection oven w/
thermal 36 C.
- CMOS stabalization of device juntion temperature ensuring consistent
edge placement
- Bipolar: uniform power density, low temperature coefficient
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- Liquid cooling
- Plumbing, pumps, heat exchange units
- Each PCB cold plates to physically contact the hottest and critical
devices- heat sinks and and thermal grease
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- Build the At-Speed w/ 90 nm CMOS
- Differential LVPECL signalling from Bipolar programmable frequency
synthesizer
- Near perfect analog switches to isolate the Precision AC/DC
- Zero ON impedance, <5 pf
- 768 100/200/400 MHz FAST PINS
- 80 ps resolution, 64-tap PVT-impervious per-pin programmable deskew
- At 100+MHz it all about preserving data eye and centering locked clocks
- Build the Precision AC/DC w/ mature Linear, and Off-the-shelf Bipolar
Analog (Timing Generators, VComp & Digital (ECLin ps)
- Per-pin Deskew 10 ps resolution, calibration of each Driver (CMOS
programmable from -.5V to +5.5V) and Comparator Linear w/ ECL-digital
out w/ < 50ps dispersion 384 I/O to less than 100ps EPA
- ATE SOC Component Makers Brooktree/Edge and Vitesse GAAS both exited
market leaving ATE hi and dry
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- User Interface- simply a broadband connection
- Implemented via an embedded Small Board Computer with an Ethernet NIC
MAC Media Access Controller to handle the IP Stack
- AtSpex Software
- FAST
- Linux PCI Ethernet DMA Driver for Deep, Fast Pattern Loads
- Remote Command CLI
- Precision- What You Do Want to do in Windows
- Windows GUI for tester operations, AC/ DC programming
- What You Don’t Want to do in Windows:
- Store and Edit Deep, Fast Patterns Loads
- Example:
- 288 bits per PEG x 4 PEGs or 1152 bits/ 768 channels= 144 Bytes per
vector
- Now 10 Million vectors times 144 Bytes per vector= 1440 M or 1.4 GB
- Broadband to the test head- 100Mb/sec Ethernet tuned to PCI DMA
33MHz/32 bit
- Must move across the PCI Bus twice 1st from customer
network to SBC and 2nd from SBC memory to the Deep Pattern
Burst DDR DIMM’s- assume 10Mb vector load rate after overhead 1.4GB
divided by 10 Mbs per sec
- WORST CASE ALL PINS and 10Million patterns
- 1.4 x10**9/10**7= 1.4 x10**2 sec; 1400 sec 60 sec/min 60 min/hour=
23 min
- TYPICAL CASE 200 PINS 96 I/O 3 bits per pin and 96 I+O and 100,000
patterns so 2 PEGs x288 bits per PEG or 576 bits 72 Bytes per vector
- Now 100,000 times 72 Bytes per vector= 7.2 x10**6 bytes divided by
10**7= .72 secs
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